TEKTRONIX 80C05 CALIBRATION and TEKTRONIX 80C05 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the TEKTRONIX 80C05 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   TEKTRONIX 80C05   Description / Specification:    
TEKTRONIX 80C05 1520 to 1580 nm Optical Sampling Module

The Tektronix 80C05 Optical Sampling Module is designed to test long wavelength (1520--1580 nm) signals. This module is intended to be used as a test and measurement tool for high bandwidth telecommunications with its high optical bandwidth >40 GHz. It has three user-selectable optical bandwidths; 20 GHz, 30 GHz and 40 GHz, or one reference receiver response; OC-192/STM-64 for 9.953 Gb/s Sonet/SDH standards. Specifications. Number of input channels: 1 optical. Effective wavelength range, typical: 1520 nm to 1580 nm. Internal fiber diameter: 9 µm/125 µm single mode. Optical return loss: >30 dB. Absolute maximum nondestructive optical input: 20 mW average power; 60 mW power at wavelength with highest relative responsivity. Maximum operating ranges: to 30 mW displayed limits, not including offset. However, signal limit is 10 mW average optical power, 20 mW displayed peak power at wavelength with highest relative responsivity. Calibrated wavelengths: 1550 nm ±20 nm. Main-instrument display vertical scale factors: 3 mW per division (max), 30 µW per division (min). Vertical offset range: ±15 mW offset relative to center of waveform display (5 divisions from either top or bottom of waveform display). Rise time, typical: 40 GHz <12 ps, 30 GHz <16 ps, 20 GHz <25 ps, OC-192/STM-64 47 ps ±10 ps.



 

Standard Calibration $915.00 *
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*This is a Web introductory price for one calibration of the TEKTRONIX 80C05. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity
Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity
Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.

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