YOKOGAWA DL750-701210 CALIBRATION and YOKOGAWA DL750-701210 REPAIR

 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the YOKOGAWA DL750-701210 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   YOKOGAWA DL750-701210   Description / Specification:    
YOKOGAWA DL750-701210 Digital Oscilloscope / Chart Recorder Mainframe

The Yokogawa DL750-701210 Digital Oscilloscope / Chart Recorder Mainframe (16 isolated channels + 16-bit logic) 12 mm width A6 thermal printer built-in. Features. Number of Slots 8 (up to 16 channels). Maximum sampling rate: 10 MS/s (module dependent). Logic inputs: 16 (8 bits x 2). Max. record length: Standard 2.5 MW/CH, 50 MW total; /M1 10 MW/CH, 250 MW total; /M2 25 MW/CH, 500 MW total; /M3 50 MW/CH, 1 GW total. Time axis accuracy: ±0.005%. Time axis setting range: 500 ns-30 sec/div, 1 min-30 min/div, 1 h-12 h/div, 1 day-3 days/div (up to 30 days). Acquisition modes Normal, Envelope, Averaging, Box average. Display: 10.4-inch color TFT liquid crystal display (SVGA 800 x 600 dots). 112 mm width A6 thermal printer built-in. Plug-in Modules. 701250, High-speed 10 MS/s 12-bit isolation module (2 CH). 701251, High-speed 1 MS/s 16-bit isolation module (2 CH). 701255, High-speed 10 MS/s 12-bit non-isolation module (2 CH). 701260, High-voltage 100 kS/s 16-bit isolation module (2 CH, with RMS). 701261, Universal Module (2 CH). 701262, Universal Module (with AAF 2 CH). 701265, Temperature/high-precision voltage module (2 CH). 701270, Strain module (NDIS, 2 CH). 701271, Strain module (DSUB, Shunt-CAL, 2 CH). 701275, Acceleration/voltage module (with AAF, 2 CH). 701280, Frequency module (2 CH).



 

Standard Calibration $350.00 *
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*This is a Web introductory price for one calibration of the YOKOGAWA DL750-701210. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity
Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity
Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.


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