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The HP 3785B Jitter Generator and Receiver is a dedicated jitter test set for evaluating the performance for the North American digital hierarchy, and it has interfaces at the DS1, DS1C, DS2, and DS3 levels (1.544,3 .152,6.3 12, and 44.736 Mb/s). Results logging, remote monitoring applications, and automated production testing are facilitated with full HP-IB capability. The jitter generator can modulate the internal crystal clock or an externally applied clock to generate a jittered test signal at one of the interface bit rates. For jitter tolerance testing, the amplitude and frequency of the applied jitter can be set manually, or it can be automatically swept, transient-free, through a jitter tolerance mask programmed into the instrument. Jitter can be measured on data signals either out-of-service or in-service. A built-in amplifier facilitates measurements at protected monitor points. Measurements can also be made on the clock input. The reference clock for jitter measurements can be internally derived from received data or clock, or it can be supplied externally. Unfiltered broadband or a choice of filtering is provided for selective band-limited jitter measurements. A demodulated jitter output is available, for applications such as spectrum analysis.
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