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two voltage monitor units (VMUs). The HP 4155B is best suited for basic semiconductor applications with its nonkelvin connections, 10 fA/1 µV resolution, and 100 mA/100 V measurement range. For critical low-level characterization, the HP 4156B extends current resolution to 1 fA and accuracy to 20 fA. The HP 4156B utilizes full-kelvin remote sensing on each SMU. At any time, you can add the HP 41501B SMU and Pulse Generator Expander, which is supplied with a 0 V/1.6 A Ground Unit. The expander accepts two 100 mA/100 V SMUs or one 1 A/200 V SMU, and two specially-synchronized 40 V/200 mA/1 µs pulse generators. HP 4156B can perform staircase and pulse sweep measurement, and sampling (time-domain) measurement using many measurement units, including units in the HP 41501B, without changing connections. Moreover you can easily perform stress-measure cycling test for reliability evaluation such as hot carrier injection and flash EEPROM test. Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or HP-IB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curve tracer operation. The measurement and analysis results are displayed on the color LCD, and you can superimpose stored graphics from four graphic memories for comparison. A number of powerful graphical analysis tools make it easy to analyze and extract many parameters such as hFE and Vth. Setup, measurement, and analysis data can be output via HP-IB, parallel or network interface 10 Base-T LAN to a color plotter and printer. You can also save the data onto a disk via network or 3.5-inch disk in MSDOS or LIF format. Graphic (HP-GL, PCL or TIF) output file allows you to transfer graphics to desktop publishing software.
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