Keysight (Agilent) 4291B CALIBRATION and Keysight (Agilent) 4291B REPAIR

 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the Keysight (Agilent) 4291B Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   Keysight (Agilent) 4291B   Description / Specification:    
Keysight (Agilent) 4291B RF Impedance/Material Analyzer

The HP 4291B RF impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials. The HP 4291B uses a direct current-voltage measurement technique, opposing the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is ± 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8-m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT. The HP 4291B also provides automatic level control and monitor of test signals by using IBASIC programming function; devices can be measured under a constant voltage or current. Measure bias-dependent impedance characteristics with optional dc bias (up to 40 V and 100 mA). At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit constant values of five circuit models. The HP 4291B has two measurement channels; each channel can be set to measure a single (e.g. Z) or dual (e.g. Z-theta) impedance parameter. The color TFT with split-display can show both active traces and memory traces (stored in RAM). Specifications. Measurement Impedance Parameters: |Z|, |Y|, theta, R, X, G, B, Cp, Cs, Lp, Ls, Rp, Rs, D, Q. Measurement Operating Frequency: 1 MHz to 1.8 GHz. Frequency Resolution: 1 mHz. Frequency Reference Accuracy: < ± 10 ppm/year @ ± 5° C. Options. Opt 1D5 Add High-Stability Frequency Reference. Opt 001 Add DC Bias. Opt 002 Add Material Measurement Software. Opt 011 Delete High-Impedance Test Head. Opt 012 Add Low-Impedance Test Head. Opt 013 Add High-Temperature High-Impedance Test Head. Opt 014 Add High-Temperature Low-Impedance Test Head.



 

Standard Calibration $645.00 *
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*This is a Web introductory price for one calibration of the Keysight (Agilent) 4291B. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity
Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity
Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.


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