Keysight (Agilent) B1500A REPAIR and Keysight (Agilent) B1500A CALIBRATION
 
Custom-Cal has a high success rate in the repair of the Keysight (Agilent) B1500A. A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the Keysight (Agilent) B1500A Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   Keysight (Agilent) B1500A   Description / Specification:    
Keysight (Agilent) B1500A Semiconductor Device Analyzer

The Agilent B1500A Semiconductor Device Analyzer of Precision Current-Voltage Mainframe is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device. It has a 15-inch touch screen with ten available slots allows you to add or upgrade measurement modules.

Current versus voltage (IV) measurement.
  Accurate and precise measurement ranges of 0.1 fA - 1 A and 0.5 μV - 200 V.
  Spot and sweep measurement.
  Time sampling measurements (100 μs minimum sampling rate).
  Pulsed measurement with minimum pulse widths of 50 μs using the MCSMU or 500 μs using the HPSMU, MPSMU, or HRSMU.
  The ASU (atto-sense and switch unit) can be used with the MPSMU, or HRSMU to provide 0.1 fA measurement resolution and SMU/AUX path switching.
  Two analog-to-digital converter choices (high-resolution ADC or high-speed ADC) available for each SMU type (HPSMU, MPSMU and HRSMU).

Capacitance measurement.
  Multi-frequency AC impedance measurement supports CV (capacitance versus voltage), C-t (capacitance versus time) and C-f (capacitance versus frequency) measurement.
  Capacitance measurement frequency range of 1 kHz to 5 MHz.
  Quasi-Static Capacitance-Voltage (QS-CV) measurement with leakage current compensation.
  Automated switching between IV and CV measurements using either the optional SCUU (SMU CMU unify unit) and GSWU (guard switch unit) or a pair of ASUs.

Pulsed IV/Fast IV/Transient IV measurement.
  Provides high speed and high sensitivity measurement capability for ultra-fast IV (current-voltage), pulsed IV and transient IV measurements, including NBTI/PBTI and RTN (Random Telegraph Signal Noise) measurements.
  Arbitrary waveform generation with 10 ns programmable resolution.
  Simultaneous high-speed voltage/current measurement (200 MSa/s, 5 ns sampling rate).
  SMU technology supports pulsed IV measurement without load line effects.

Pulse Generation.
  Up to ±40 V voltage pulsing and arbitrary waveform generation for non-volatile memory evaluation.
  Single channel two-level and three level pulsing capability.



 



Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity
Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity
Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.

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