BURLEIGH WA-2500 CALIBRATION and BURLEIGH WA-2500 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the BURLEIGH WA-2500 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   BURLEIGH WA-2500 (WA2500)   Description / Specification:    
BURLEIGH WA-2500 Wavemeter Jr Wavelength Meter

The Burleigh WA-2500 Wavemeter Jr is an instrument for wavelength measurement of CW laser sources that combines accuracy with ease of use. The accuracy is +/- 1 part in 10,000 over the full wavelength range. The primary application for Model WA-2500 is measurement of the wavelength or the frequency of tunable lasers that operate from 400 to 1800 nanometers, particularly dye lasers, Ti:Sapphire lasers and diode lasers. Two detectors are provided to cover this range with high sensitivity. The VIS detector is used for lasers operating from 400 to 1100 nanometers, and the IR detector for lasers that operate from 600 to 1800 nanometers. Specifications. Wavelength Range: 400 - 1800 nm. Accuracy: 1 part in 10,000, at 1000 nm: 0.1 nm (1 cm^-1). Display Resolution(Display resolution is adjusted automatically depending on the linewidth of the measured light.): 0.01 nm (0.1 cm^-1). Display Units: Nanometers or wavenumbers in vacuum or air. Display Update Period: Normal Mode; 0.2 seconds, Average Mode 2 seconds. Input Power (Input power requirement is specified as power out of the fiber and into the instrument. For a collimated beam with a diameter 2.5 mm, coupling into the standard beam receiver is usually greater than 30%.): 20 microwatts. Beam Receiver Accessory: Coupling Head Aperture; 2.5 millimeter, Patch cord Cable Length; 3 meters. RS-232 Interface Standard (2400 Baud).



 

Standard Calibration $515.00 *
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*This is a Web introductory price for one calibration of the BURLEIGH WA-2500. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Optical Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Bit Error Ratio (BER)
Bit Error Ratio (BER) is the ratio of errors caused by the number of bits in a data stream that have been altered due to noise, interference, distoriton or bit synchronization errors.

Flatness
Variation of insertion loss on the passband of an optical device.

Polarization Dependent Loss (PDL)
Polarization Dependent Loss is the difference between the maximum and minimum values of loss due to the variation of the polarization states of light propagating through a device. PDL is expressed in decibels. Calculated by; PDL = 10 log10 (Ep/Es), where EP and ES are the measured diffraction efficiencies for P- and S-plane polarized incident light, respectively.

Return Loss (RL)
Return Loss (RL) is the ratio of the incident power to the reflected power expressed in dB. RL = 10log (Pin/Pback)

Wavelength Resolution
Wavelength Resolution is the smallest possible displayed wavelength increment/decrement.

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