FLUKE 1503 CALIBRATION and FLUKE 1503 REPAIR

 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the FLUKE 1503 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   FLUKE 1503   Description / Specification:    
FLUKE 1503 Insulation Resistance Tester

The Fluke 1503 insulation resistance tester features an insulation test range from 0.1 MΩ to 2000 MΩ and insulation test voltages of 500 V, 1000 V. It has live circuit detection that prevents insulation test if voltage > 30 V is detected for added user protection.
Specifications.

AC/DC Voltage Measurement.
Accuracy Range: 600.0 V
Accuracy Resolution: 0.1 V
Accuracy: 50 Hz to 400 Hz ± (% of Rdg + Digits) ±(2% + 3).
Input impedance: 3 MΩ (nominal), < 100 pF.
Common mode rejection ratio (1 kΩ unbalanced): > 60 dB at DC, 50 or 60 Hz.
Overload protection: 600 V rms or DC.

Earth Bond Resistance Measurement.
Range/Resolution:
  20.00 Ω / 0.01 Ω,
  200.0 Ω / 0.1 Ω,
  2000 Ω / 1.0 Ω,
  20.00 kΩ / 0.01 kΩ.
Accuracy: ±(1.5% + 3).
Overload protection: 2 V rms or DC.
Open circuit test voltage: > 4.0 V, < 8 V.
Short circuit current: > 200.0 mA.

Insulation Specifications.
Measurement range: 0.01 MΩ to 2000 MΩ.
Test voltage: 500 V, 1000 V.
Test voltage accuracy: + 20%, - 0%.
Short circuit current: 1 mA nominal.
Auto discharge: discharge time < 0.5 second for C = 1 µF or less.
Live circuit indicator: inhibit test if terminal voltage > 30 V prior to initialization of test.
Maximum capacitive load: operable with up to 1 µF load.
Measure accuracy:
  500 V ±(1.5% + 5),
  1000 V ±(1.5% + 5) to 2000 MΩ, ±(10% + 3) above 2000 MΩ.



 



Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Channel Bandwidth
Channel Bandwidth is the bandwidth over which power is measured. This is usually the bandwidth in which almost all of the power of a signal is contained.

Jitter
Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. Jitter is the time variation of a periodic signal in electronics and telecommunications, often in relation to a reference clock source. Jitter may be observed in characteristics such as the frequency of successive pulses, the signal amplitude, or phase of periodic signals. Jitter is a significant, and usually undesired, factor in the design of almost all communications links (e.g., USB, PCI-e, SATA, OC-48). In clock recovery applications it is called timing jitter.

Overshoot
Overshoot is the distortion that follows a major transition; the difference between the peak power point and the pulse-top amplitude computed as a percentage of the pulse-top amplitude.

Rise Time
Rise time refers to the time required for a signal to change from a specified low value to a specified high value, usually 10 and 90 percent of pulse-top amplitude (vertical display is linear power).


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