Agilent 34970A

Although the Agilent 34970A is currently in support by the OEM, Custom-Cal has been successful in performing test equipment repairs while staying below OEM cost. By repairing the original unit, you are not forced to make changes to your asset tracking system such as asset update or serial number changes. So, in the end, the most you will pay is the OEM repair cost, but most likely we will be able to perform the repair for less.
 
The Agilent 34970A consists of a three-slot mainframe with a built-in 6 1/2 digit digital multimeter (Option 001, removes the DMM). Each channel can be configured independently to measure one of 11 different functions without the added cost or hassles of signal-conditioning accessories. Choose from eight optional plug-in modules to create a compact data logger, full-featured data acquisition system or low-cost switching unit. On-module screw-terminal connections eliminate the need for terminal blocks and a unique relay maintenance feature counts every closure on every switch for easy, predictable relay maintenance. The Agilent 34971A Data Acquisition Pro combines the Agilent 34970A Data Acquisition Unit, 34901A 20-Channel Multiplexer and the BenchLink Data Logger Pro.
 

Agilent 34970A Self Test Errors (Error Codes):

  Agilent 34970A User Manual PDF
601 Front panel not responding The main CPU A1U205 attempts to establish serial communications with the front panel processor A2U1. During this test, A2U1 turns on all display segments. Communication must function in both directions for this test to pass. If this error is detected during power-up self-test, the instrument will beep. This error is only readable from the remote interface.
602 RAM read/write failed This test writes and reads a 55h and AAh checkerboard pattern to each address of RAM. Any incorrect readback will cause a test failure. This error is only readable from the remote interface.
603 A / D sync stuck The main CPU issues an A/ D sync pulse to A1U209 and A1U205 to latch the value in the ADC slope counters. A failure is detected when a sync interrupt is not recognized and a subsequent time-out occurs.
604 A / D slope convergence failed The input amplifier is configured to the measure zero (MZ) state in the 10 V range. This test checks whether the ADC integrator produces nominally the same number of positive and negative slope decisions (± 10%) during a 20 ms interval.
605 Cannot calibrate rundown gain This test checks the nominal gain between the integrating ADC and the A1U205 on-chip ADC. This error is reported if the procedure can not run to completion due to a hardware failure.
606 Rundown gain out of range This test checks the nominal gain between the integrating ADC and the A1U205 on-chip ADC. The nominal gain is check to ± 10% tolerance.
607 Rundown too noisy This test checks the gain repeatability between the integrating ADC and the A1U205 on-chip ADC. The gain test (606) is performed eight times. Gain noise must be less than ± 64 LSB’s of the A1U205 on-chip ADC.
608 Serial configuration readback failed This test re-sends the last 9 byte serial configuration data to all the serial path. The data is then clocked back into A1U209 and compared against the original 9 bytes sent. A failure occurs if the data do not match.
609 DC gain x1 failed This test configures for the 10 V range. The dc amplifier gain is set to X1. The measure customer (MC) input is connected to the internal TSENSE source which produces 0.6 volts. A 20 ms ADC measurement is performed and checked against a limit of 0.6 V ± 0.3 V.
610 DC gain x10 failed This test configures for the 1 V range. The dc amplifier gain is set to X10. The measure customer (MC) input is connected to the internal TSENSE source which produces 0.6 volts. A 20 ms ADC measurement is performed and checked against a limit of 0.6 V ± 0.3 V.
611 DC gain x100 failed This test configures for the 100 mV range. The dc amplifier gain is set to X100. The measure customer (MC) input is connected to the internal TSENSE source which produces 0.6 volts. A 20 ms ADC measurement is performed and checked for a + overload response.
612 Ohms 500 nA source failed This test configures to the 10 V dc range with the internal 10 M 100:1 divider A4U102 connected across the input. the 500 nA Ohms current source is connected to produce a nominal 5 V signal. A 20 ms ADC measurement is performed and the result is checked against a limit of 5 V ± 1 V.
613 Ohms 5 μA source failed This test configures the 10 V range with the internal 10 M 100:1 divider A4U102 connected across the input. The 5 μA current source is connected. The compliance limit of the current source is measured. A 20 ms ADC measurement is performed and the result is checked against a limit of 7.5 V ± 3 V.
614 DC 300V zero failed This test configures the 300 V dc range with no input applied. A 20 ms ADC measurement is performed and the result is checked against a limit of 0V ± 5 mV.
615 Ohms 10 μA source failed This test configures the 10 V range with the internal internal 10 M 100:1 divider A4U102 connected across the input. The 10 μA current source is connected. A 20 ms ADC measurement is performed and the result is checked against a limit of 7.5 V ± 3 V.
616 DC current sense failed This test configures the 1 A dc rage and function. A 20 ms ADC measurement is performed and the result is checked against a limit of 0 A ± 5 A. This test confirms that the dc current sense path is functional.
617 Ohms 100 μA source failed This test configures the 10 V range with the internal 10 M 100:1 divider A4U102 connected across the input. The 100 μA current source is connected. The compliance limit of the current source is measured. A 20 ms ADC measurement is performed and the result is checked against a limit of 5 V ± 1 V.
618 DC high voltage attenuator This test configures to the 300 Vdc range. the 500 nA ohms current source is connected to produce a nominal 5 V signal. A 20 ms ADC measurement is performed and the result is checked against a limit of –10 mV to 70 mV at the output of the rms-to-dc converter.
619 Ohms 1 mA source failed This test configures the 10 V range with the internal 1 0 M 100:1 divider A4U102 connected across the input. The 1 mA current source is connected. A 20 ms ADC measurement is performed and the result is checked against a limit of 7 V ± 3.5 V.
620 AC rms zero failed This test configures to the 100 mV ac range with the ac input grounded through A4K103. The internal residual noise of the ac section is measured and checked against a limit of –10 mV to 70 mV at the output of the rms-to-dc converter.
621 AC rms full scale failed This test configures for the 100 mV ac range. The 1 mA ohms current source is switched on the charge the ac input capacitor A4C301. This produces a pulse on the output of the rms-to-dc converter which is sampled 100 ms after the current is applied. A 20 ms A/D measurement is performed and checked against a limit of 10 V ± 8.5 V into the ADC.
622 Frequency counter failed This test configures for the 100 mV ac range. This test immediately follows test 621. With A4C301 holding charge from test 621 the ac input is now switched to ground through A4K103. This produces a positive pulse on the input to the frequency comparator A4U310. While C301 discharges, the ENAB FREQ bit is toggled four times to produce a frequency input to the counter logic in A1U205. A failure occurs if the counter can not measure the frequency input.
623 Cannot calibrate precharge This test configures to the 100 V dc range with no input. The ADC is configured for 200 ms measurements. The A1U205 pulse width modulated (PWM) DAC output (C224) is set to about 4 volts. A reading is taken in with A4U101 in the MC state. A second reading is taken in the PRE state. The precharge amplifier voltage offset is calculated. The A1U205 DAC output is set to about 1.5 volts and the precharge offset is measured again. The gain of the offset adjustment is calculated. This test assures a precharge amplifier offset is achievable.
624 Unable to sense line frequency This test checks that the LSENSE logic input to A1U205 is toggling. If no logic input is detected, the meter will assume a 50 Hz line operation for all future measurements.
625 I/O processor did not respond This test checks that communications can be established between A1U205 and A1U305 through the optically isolated (A1U213 and A1U214) serial data link. Failure to establish communication in either direction will generate an error. If this condition is detected at power-on self-test, the instrument will beep and the error annunciator will be on.
626 I/O processor failed self-test A failure occurred when the earth referenced processor, AU305, executed an internal RAM test.

Agilent 34970A Plug-in Modules:








34901A 20 Channel Multiplexer (2/4-wire) Module
  • 60 ch/s scanning
  • Two- and four-wire scanning
  • Built-in thermocouple reference junction
  • 300 V switching
The Agilent 34901A is the most versatile multiplexer for general purpose scanning. It combines dense, multifunction switching with 60-channel/ second scan rates to address a broad spectrum of data acquisition applications. Two- and four-wire channels can be-mixed on the same module. Two-additional fused inputs (22-channels total) route up to 1A-of-current to the internal DMM, allowing ac and dc current measurements without the need for external shunt resistors.
   
34902A 16-Channel High-Speed Multiplexer
  • 250 ch/s scanning
  • Two- and four-wire scanning
  • Built-in thermocouple reference junction
The Agilent 34902A employs reed relays-to achieve scan rates up to 250 channels per second. Use this module for high-throughput automated test applications as well-as high-speed data logging and monitoring tasks. Sixteen two-wire inputs switch up to 300-V. Two- and four-wire channels may be mixed on the same module. User provided shunt resistors are required for current measurements.
   
34903A 20-Channel Actuator/General Purpose Switch
  • SPDT (Form C) latching relays
  • 300 V, 1A actuation and control
This general-purpose switch module has 20 independent single-pole, double-throw (SPDT) relays. Use it to cycle power to products under test, control indicator and status lights, and to actuate external power relays and solenoids. Combine it with matrix and multiplexer modules to build custom switch systems. Its 300 V, 1A contacts can handle up to 50 W, enough for many power line switching applications.
   
34904A 4x8 Two-wire Matrix Switch
  • SPDT (Form C) latching relays
  • 300 V, 1A actuation and control
The Agilent 34904A gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8x8, 4x16 or larger matrices, with up to 96 crosspoints in a single frame.
   
34905A 50Ω Dual 4-channel RF Multiplexers
  • 2 GHz bandwidth
  • BNC to SMB adapter cables-included
The Agilent 34905A 50Ω RF multiplexers offer broadband switching capabilities for highfrequency and pulsed signals. Use them to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1x4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2-GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 GHz bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies—create a stubless 16:1 multiplexer in a single frame.
   
34906A 75Ω Dual 4-channel RF Multiplexers
  • 2 GHz bandwidth
  • BNC to SMB adapter cables-included
The Agilent 34905A 75Ω RF multiplexers offer broadband switching capabilities for highfrequency and pulsed signals. Use them to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1x4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2-GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 GHz bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies—create a stubless 16:1 multiplexer in a single frame.
   
34907A Multifunction Module
  • 16 bits of digital input and output
  • 100 kHz totalizer input
  • Two ±12V analog outputs
The Agilent 34907A allows great flexibility for a variety of sense and control applications. It combines two 8-bit ports of digital input and output, a 100 kHz gated totalizer, and two ±12V analog outputs— all-on a single earth-referenced module. The digital inputs and totalizer input may be included in a scan. Alarm limits for the digital and event counter inputs are evaluated continuously, capturing and logging alarm conditions even between scans.
   
34908A Multifunction Module
  • 60 ch/s scanning
  • Single-wire switching for common-low applications
  • Built-in thermocouple reference-junction
Use the Agilent 34908A for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing. Each module switches 40 one-wire inputs. All two-wire internal measurements except current are supported. The module low connection is isolated from earth and can float up to 300 V.
   
Description of the Agilent 
Data Acquisition Unit consists of a three-slot mainframe with a built-in 6 1/2 digit digital multimeter.
• 3-slot mainframe with built-in GPIB and RS232 interfaces
• 6 1/2-digit (22-bit) internal DMM, scanning up to 250 channels per second
• 8 switch and control plug-in modules to choose from
• Built-in signal conditioning measures thermocouples, RTDs and thermistors, ac/dc volts and current; resistance; frequency and period
• 50k readings of non-volatile memory holds data when power is removed
• Hi/LO alarm limits on each channel, plus 4 TTL alarm outputs
 

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